xref: /linux/arch/sparc/include/asm/estate.h (revision 24168c5e6dfbdd5b414f048f47f75d64533296ca)
1 /* SPDX-License-Identifier: GPL-2.0 */
2 #ifndef _SPARC64_ESTATE_H
3 #define _SPARC64_ESTATE_H
4 
5 /* UltraSPARC-III E-cache Error Enable */
6 #define ESTATE_ERROR_FMT	0x0000000000040000 /* Force MTAG ECC		*/
7 #define ESTATE_ERROR_FMESS	0x000000000003c000 /* Forced MTAG ECC val	*/
8 #define ESTATE_ERROR_FMD	0x0000000000002000 /* Force DATA ECC		*/
9 #define ESTATE_ERROR_FDECC	0x0000000000001ff0 /* Forced DATA ECC val	*/
10 #define ESTATE_ERROR_UCEEN	0x0000000000000008 /* See below			*/
11 #define ESTATE_ERROR_NCEEN	0x0000000000000002 /* See below			*/
12 #define ESTATE_ERROR_CEEN	0x0000000000000001 /* See below			*/
13 
14 /* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache
15  * errors 2) uncorrectable E-cache errors.  Such events only occur on reads
16  * of the E-cache by the local processor for: 1) data loads 2) instruction
17  * fetches 3) atomic operations.  Such events _cannot_ occur for: 1) merge
18  * 2) writeback 2) copyout.  The AFSR bits associated with these traps are
19  * UCC and UCU.
20  */
21 
22 /* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps
23  * for uncorrectable ECC errors and system errors.
24  *
25  * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT,
26  * or system bus BusERR:
27  * 1) As the result of an instruction fetch, will generate instruction_access_error
28  * 2) As the result of a load etc. will generate data_access_error.
29  * 3) As the result of store merge completion, writeback, or copyout will
30  *    generate a disrupting ECC_error trap.
31  * 4) As the result of such errors on instruction vector fetch can generate any
32  *    of the 3 trap types.
33  *
34  * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE,
35  * BERR, and TO.
36  */
37 
38 /* CEEN enables the ECC_error trap for hardware corrected ECC errors.  System bus
39  * reads resulting in a hardware corrected data or MTAG ECC error will generate an
40  * ECC_error disrupting trap with this bit enabled.
41  *
42  * This same trap will also be generated when a hardware corrected ECC error results
43  * during store merge, writeback, and copyout operations.
44  */
45 
46 /* In general, if the trap enable bits above are disabled the AFSR bits will still
47  * log the events even though the trap will not be generated by the processor.
48  */
49 
50 #endif /* _SPARC64_ESTATE_H */
51