xref: /freebsd/sys/dev/rndtest/rndtest.h (revision dd41de95a84d979615a2ef11df6850622bf6184e)
1 /*	$FreeBSD$	*/
2 /*	$OpenBSD$	*/
3 
4 /*-
5  * SPDX-License-Identifier: BSD-4-Clause
6  *
7  * Copyright (c) 2002 Jason L. Wright (jason@thought.net)
8  * All rights reserved.
9  *
10  * Redistribution and use in source and binary forms, with or without
11  * modification, are permitted provided that the following conditions
12  * are met:
13  * 1. Redistributions of source code must retain the above copyright
14  *    notice, this list of conditions and the following disclaimer.
15  * 2. Redistributions in binary form must reproduce the above copyright
16  *    notice, this list of conditions and the following disclaimer in the
17  *    documentation and/or other materials provided with the distribution.
18  * 3. All advertising materials mentioning features or use of this software
19  *    must display the following acknowledgement:
20  *	This product includes software developed by Jason L. Wright
21  * 4. The name of the author may not be used to endorse or promote products
22  *    derived from this software without specific prior written permission.
23  *
24  * THIS SOFTWARE IS PROVIDED BY THE AUTHOR ``AS IS'' AND ANY EXPRESS OR
25  * IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED
26  * WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
27  * DISCLAIMED.  IN NO EVENT SHALL THE AUTHOR BE LIABLE FOR ANY DIRECT,
28  * INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES
29  * (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR
30  * SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION)
31  * HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
32  * STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN
33  * ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE
34  * POSSIBILITY OF SUCH DAMAGE.
35  */
36 
37 /* Some of the tests depend on these values */
38 #define	RNDTEST_NBYTES	2500
39 #define	RNDTEST_NBITS	(8 * RNDTEST_NBYTES)
40 
41 struct rndtest_state {
42 	device_t	rs_parent;	/* associated device */
43 	u_int8_t	*rs_end, *rs_begin, *rs_current;
44 	struct callout	rs_to;
45 	int		rs_collect;	/* collect and test data */
46 	int		rs_discard;	/* discard/accept random data */
47 	u_int8_t	rs_buf[RNDTEST_NBYTES];
48 };
49 
50 struct rndtest_stats {
51 	u_int32_t	rst_discard;	/* number of bytes discarded */
52 	u_int32_t	rst_tests;	/* number of test runs */
53 	u_int32_t	rst_monobit;	/* monobit test failures */
54 	u_int32_t	rst_runs;	/* 0/1 runs failures */
55 	u_int32_t	rst_longruns;	/* longruns failures */
56 	u_int32_t	rst_chi;	/* chi^2 failures */
57 };
58 
59 extern 	struct rndtest_state *rndtest_attach(device_t dev);
60 extern	void rndtest_detach(struct rndtest_state *);
61 extern	void rndtest_harvest(struct rndtest_state *arg, void * buf, u_int len);
62