xref: /freebsd/sys/dev/rndtest/rndtest.h (revision 71625ec9ad2a9bc8c09784fbd23b759830e0ee5f)
1 /*	$OpenBSD$	*/
2 
3 /*-
4  * SPDX-License-Identifier: BSD-4-Clause
5  *
6  * Copyright (c) 2002 Jason L. Wright (jason@thought.net)
7  * All rights reserved.
8  *
9  * Redistribution and use in source and binary forms, with or without
10  * modification, are permitted provided that the following conditions
11  * are met:
12  * 1. Redistributions of source code must retain the above copyright
13  *    notice, this list of conditions and the following disclaimer.
14  * 2. Redistributions in binary form must reproduce the above copyright
15  *    notice, this list of conditions and the following disclaimer in the
16  *    documentation and/or other materials provided with the distribution.
17  * 3. All advertising materials mentioning features or use of this software
18  *    must display the following acknowledgement:
19  *	This product includes software developed by Jason L. Wright
20  * 4. The name of the author may not be used to endorse or promote products
21  *    derived from this software without specific prior written permission.
22  *
23  * THIS SOFTWARE IS PROVIDED BY THE AUTHOR ``AS IS'' AND ANY EXPRESS OR
24  * IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED
25  * WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
26  * DISCLAIMED.  IN NO EVENT SHALL THE AUTHOR BE LIABLE FOR ANY DIRECT,
27  * INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES
28  * (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR
29  * SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION)
30  * HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
31  * STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN
32  * ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE
33  * POSSIBILITY OF SUCH DAMAGE.
34  */
35 
36 /* Some of the tests depend on these values */
37 #define	RNDTEST_NBYTES	2500
38 #define	RNDTEST_NBITS	(8 * RNDTEST_NBYTES)
39 
40 struct rndtest_state {
41 	device_t	rs_parent;	/* associated device */
42 	u_int8_t	*rs_end, *rs_begin, *rs_current;
43 	struct callout	rs_to;
44 	int		rs_collect;	/* collect and test data */
45 	int		rs_discard;	/* discard/accept random data */
46 	u_int8_t	rs_buf[RNDTEST_NBYTES];
47 };
48 
49 struct rndtest_stats {
50 	u_int32_t	rst_discard;	/* number of bytes discarded */
51 	u_int32_t	rst_tests;	/* number of test runs */
52 	u_int32_t	rst_monobit;	/* monobit test failures */
53 	u_int32_t	rst_runs;	/* 0/1 runs failures */
54 	u_int32_t	rst_longruns;	/* longruns failures */
55 	u_int32_t	rst_chi;	/* chi^2 failures */
56 };
57 
58 extern 	struct rndtest_state *rndtest_attach(device_t dev);
59 extern	void rndtest_detach(struct rndtest_state *);
60 extern	void rndtest_harvest(struct rndtest_state *arg, void * buf, u_int len);
61