xref: /linux/tools/testing/selftests/arm64/signal/test_signals.h (revision c34e9ab9a612ee8b18273398ef75c207b01f516d)
1 /* SPDX-License-Identifier: GPL-2.0 */
2 /* Copyright (C) 2019 ARM Limited */
3 
4 #ifndef __TEST_SIGNALS_H__
5 #define __TEST_SIGNALS_H__
6 
7 #include <signal.h>
8 #include <stdbool.h>
9 #include <ucontext.h>
10 
11 /*
12  * Using ARCH specific and sanitized Kernel headers from the tree.
13  */
14 #include <asm/ptrace.h>
15 #include <asm/hwcap.h>
16 
17 #define __stringify_1(x...)	#x
18 #define __stringify(x...)	__stringify_1(x)
19 
20 #define get_regval(regname, out)			\
21 {							\
22 	asm volatile("mrs %0, " __stringify(regname)	\
23 	: "=r" (out)					\
24 	:						\
25 	: "memory");					\
26 }
27 
28 /*
29  * Feature flags used in tdescr.feats_required to specify
30  * any feature by the test
31  */
32 enum {
33 	FSSBS_BIT,
34 	FSVE_BIT,
35 	FSME_BIT,
36 	FSME_FA64_BIT,
37 	FSME2_BIT,
38 	FGCS_BIT,
39 	FMAX_END
40 };
41 
42 #define FEAT_SSBS		(1UL << FSSBS_BIT)
43 #define FEAT_SVE		(1UL << FSVE_BIT)
44 #define FEAT_SME		(1UL << FSME_BIT)
45 #define FEAT_SME_FA64		(1UL << FSME_FA64_BIT)
46 #define FEAT_SME2		(1UL << FSME2_BIT)
47 #define FEAT_GCS		(1UL << FGCS_BIT)
48 
49 /*
50  * A descriptor used to describe and configure a test case.
51  * Fields with a non-trivial meaning are described inline in the following.
52  */
53 struct tdescr {
54 	/* KEEP THIS FIELD FIRST for easier lookup from assembly */
55 	void			*token;
56 	/* when disabled token based sanity checking is skipped in handler */
57 	bool			sanity_disabled;
58 	/* just a name for the test-case; manadatory field */
59 	char			*name;
60 	char			*descr;
61 	unsigned long		feats_required;
62 	unsigned long		feats_incompatible;
63 	/* bitmask of effectively supported feats: populated at run-time */
64 	unsigned long		feats_supported;
65 	bool			initialized;
66 	unsigned int		minsigstksz;
67 	/* signum used as a test trigger. Zero if no trigger-signal is used */
68 	int			sig_trig;
69 	/*
70 	 * signum considered as a successful test completion.
71 	 * Zero when no signal is expected on success
72 	 */
73 	int			sig_ok;
74 	/*
75 	 * expected si_code for sig_ok, or 0 to not check
76 	 */
77 	int			sig_ok_code;
78 	/* signum expected on unsupported CPU features. */
79 	int			sig_unsupp;
80 	/* a timeout in second for test completion */
81 	unsigned int		timeout;
82 	bool			triggered;
83 	bool			pass;
84 	unsigned int		result;
85 	/* optional sa_flags for the installed handler */
86 	int			sa_flags;
87 	ucontext_t		saved_uc;
88 	/* used by get_current_ctx() */
89 	size_t			live_sz;
90 	ucontext_t		*live_uc;
91 	volatile sig_atomic_t	live_uc_valid;
92 	/* optional test private data */
93 	void			*priv;
94 
95 	/* a custom setup: called alternatively to default_setup */
96 	int (*setup)(struct tdescr *td);
97 	/* a custom init: called by default test init after test_setup */
98 	bool (*init)(struct tdescr *td);
99 	/* a custom cleanup function called before test exits */
100 	void (*cleanup)(struct tdescr *td);
101 	/* an optional function to be used as a trigger for starting test */
102 	int (*trigger)(struct tdescr *td);
103 	/*
104 	 * the actual test-core: invoked differently depending on the
105 	 * presence of the trigger function above; this is mandatory
106 	 */
107 	int (*run)(struct tdescr *td, siginfo_t *si, ucontext_t *uc);
108 	/* an optional function for custom results' processing */
109 	void (*check_result)(struct tdescr *td);
110 };
111 
112 extern struct tdescr tde;
113 #endif
114