/* $OpenBSD$ */ /*- * SPDX-License-Identifier: BSD-4-Clause * * Copyright (c) 2002 Jason L. Wright (jason@thought.net) * All rights reserved. * * Redistribution and use in source and binary forms, with or without * modification, are permitted provided that the following conditions * are met: * 1. Redistributions of source code must retain the above copyright * notice, this list of conditions and the following disclaimer. * 2. Redistributions in binary form must reproduce the above copyright * notice, this list of conditions and the following disclaimer in the * documentation and/or other materials provided with the distribution. * 3. All advertising materials mentioning features or use of this software * must display the following acknowledgement: * This product includes software developed by Jason L. Wright * 4. The name of the author may not be used to endorse or promote products * derived from this software without specific prior written permission. * * THIS SOFTWARE IS PROVIDED BY THE AUTHOR ``AS IS'' AND ANY EXPRESS OR * IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED * WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE * DISCLAIMED. IN NO EVENT SHALL THE AUTHOR BE LIABLE FOR ANY DIRECT, * INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES * (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR * SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) * HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, * STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN * ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE * POSSIBILITY OF SUCH DAMAGE. */ /* Some of the tests depend on these values */ #define RNDTEST_NBYTES 2500 #define RNDTEST_NBITS (8 * RNDTEST_NBYTES) struct rndtest_state { device_t rs_parent; /* associated device */ u_int8_t *rs_end, *rs_begin, *rs_current; struct callout rs_to; int rs_collect; /* collect and test data */ int rs_discard; /* discard/accept random data */ u_int8_t rs_buf[RNDTEST_NBYTES]; }; struct rndtest_stats { u_int32_t rst_discard; /* number of bytes discarded */ u_int32_t rst_tests; /* number of test runs */ u_int32_t rst_monobit; /* monobit test failures */ u_int32_t rst_runs; /* 0/1 runs failures */ u_int32_t rst_longruns; /* longruns failures */ u_int32_t rst_chi; /* chi^2 failures */ }; extern struct rndtest_state *rndtest_attach(device_t dev); extern void rndtest_detach(struct rndtest_state *); extern void rndtest_harvest(struct rndtest_state *arg, void * buf, u_int len);